Manufacturers of metrology systems are increasingly turning to ultra-large area scan cameras—such as 25-megapixel CMOS sensors—to boost accuracy and throughput. However, defects in these images can undermine the performance benefits gained from such high-resolution technology.

Addressing Image Sensor Variations with Active Sensor Control (ASC)

The output of image sensors can vary significantly from pixel to pixel due to differences in exposure response. This variation is precisely what Active Sensor Control (ASC) addresses by calibrating the sensor’s output.

External factors like lighting conditions, optical components, and temperature also impact image quality—especially when working with ultra-high-resolution CMOS sensors. Adimec’s ASC technology enables field calibration that compensates for all disturbances, including those caused by system configurations or changes over time. This ensures images remain free of artifacts, maintaining accuracy in metrology applications.

These in-camera functions reduce computational demands on frame grabbers and CPUs within the imaging system, lowering overall costs while improving performance.

Leveraging ASC for Better Imaging

In this white paper, we explore scenarios where Active Sensor Control delivers maximum benefits and demonstrate how it provides more usable pixels compared to cameras without ASC. The result is a superior starting image that enhances metrology workflows.

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Last Updated: 2025-09-04 19:36:36