Maximizing Performance: The Role Of High-Resolution Cameras In Metrology Systems
Achieving the benefits of high-resolution camera technology requires a fully usable image sensor. Metrology cameras are specifically designed with uniformity, dynamic range, and other parameters optimized to deliver highly accurate starting images—critical for precise measurements in semiconductor manufacturing systems and process control applications.
Active Sensor Control: Ensuring Maximum Usability
Adimec’s Active Sensor Control (ASC) is a comprehensive system that ensures metrology cameras achieve optimal performance. It integrates all functions necessary to fine-tune sensors according to application requirements, while implementing measures to enhance imaging quality under specific operational conditions.
The process involves three sequential steps:
Step 1: Sensor Technology Characterization
- Gain in-depth understanding of image sensor variations and performance across different conditions.
- Apply individualized settings for each sensor based on its operating environment.
Step 2: Operational Tuning During Production
- Measure critical artifacts inherent to the camera-sensor combination.
- Conduct tests beyond standard specifications to ensure consistent performance.
Step 3: Field Calibration
- Optimize parameters specific to both image sensors and measurement methods.
- Implement embedded functions for automatic calibration adjustments in operational environments.
The Path To Reliable Imaging Performance
By minimizing sensor artifacts per camera, ASC ensures maximum imaging range (DNR) while reducing the need for intensive corrections that could impact contrast range. These carefully calibrated tuning processes guarantee consistent image quality across measurements, delivering reliable results essential for precision metrology applications.
Related Reading:
- Detect smaller features with metrology cameras
- Ways to increase throughput in semiconductor and electronics inspection
- Industrial metrology cameras for increased performance of process control systems
Last Updated: 2025-09-04 20:04:47