At this year’s AOI Forum & Show (September 28, 2017), The Imaging Source collaborated with MiM Tech software and Hi Keen Tech lenses to showcase the highly versatile imaging solution known as IC iVision. To demonstrate its capabilities in dynamic object tracking and surface defect inspection, The Imaging Source’s “33 series” GigE camera, specifically the DMK 33GP1300, was paired with Hi Keen’s low-distortion lens and MiM Tech’s image processing library.

The demonstration highlighted IC iVision through a display featuring the DMK 33GP1300 GigE camera, Hi Keen’s telecentric lens, along with software developed by MiM Tech.

Held at The National Chiao Tung University in Hsinchu, Taiwan—an esteemed institution for electrical and computer engineering—the event served as an ideal venue for the one-day exhibition. Organized annually by AOIEA, this forum provides a platform for students and researchers engaged in automated optical inspection to interact with integrators, component suppliers, equipment manufacturers, and academic professionals. The focus remains on showcasing advancements in both hardware and software within the industry.

Last Updated: 2025-09-05 00:46:45