JAI has announced a new addition to its industrial line scan camera lineup: the SW-4010Q-MCL model. This innovative device features 4-sensor line scan technology, enabling simultaneous capture of red, green, and blue image data across three separate CMOS sensors. A fourth sensor utilizes indium gallium arsenide (InGaAs) technology to collect short wave infrared (SWIR) spectrum data.

Discover the New Sweep+ Model

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The SW-4010Q-MCL joins JAI’s existing Sweep+ Series, which includes 3-CMOS R-G-B and 4-CMOS R-G-B-NIR line scan cameras. This expansion extends multispectral imaging capabilities to include SWIR wavelengths. Like other 4-CMOS R-G-B-NIR models from JAI, the infrared channel reveals hidden image data not visible in standard light conditions.

SWIR Light Offers Unique Advantages: Unlike NIR light, SWIR has distinct physical properties regarding absorption, transmission, and reflection when interacting with objects. This creates new opportunities for detecting hidden defects beneath surfaces during inspection processes.

Sweep+ 4-Sensor Camera Benefits:

In machine vision systems requiring both visible light imaging and SWIR capabilities to meet quality standards, the SW-4010Q-MCL provides comprehensive solutions by delivering visible/SWIR images through a single scanning process. By combining CMOS sensors with InGaAs technology in one industrial camera unit, advanced color inspection becomes possible—capturing standard RGB data (400~700nm) while simultaneously gathering SWIR spectrum information (8001700nm). This integration reduces system complexity and hardware costs significantly.

Technical Specifications: Each of the three CMOS line sensors offers 4096-pixel resolution with a 7.5µm×7.5µm pixel size, covering up to 30.72mm sensor width at maximum full-resolution scan rates (20.6kHz). For comparison, the InGaAs sensor provides lower resolution (~1024 pixels) but superior performance characteristics including larger square pixels (25µm), narrower physical dimensions (25.6mm), and higher operational frequencies (39kHz).

Harmonizing Sensor Performance

A specialized noise reduction filters, dual Mini-Camera Link interfaces, and M52 lens mount compatibility allows for seamless integration into existing workflows. The camera features individual gain/shutter controls per channel plus advanced processing functions such as:

  • Individual gain adjustment capabilities per-channel control
  • Dual-stream data outputs enabling separate RGB versus SWIR transmission channels
  • Multiple color space conversion options including sRGB, Adobe RGB formats and custom user-defined matrices
  • Advanced noise reduction filters

Additional Features:

Advanced software support includes dual-camera link interfaces (Mini Camera Link) paired with an M52 mount design. Other notable features include trigger control systems for precise synchronization requirements along with encoder integration compatibility.

New Applications Driving Force

Specialized Lens Design:

JAI offers a dedicated lens optimized for handling both visible and SWIR light, available separately from the camera system. The device utilizes a dual Mini Camera Link interface format while maintaining advanced functionality options such as noise reduction filters and user-configurable color space conversions.

Advanced Processing Capabilities

The SW-4010Q-MCL includes additional capabilities like RGB conversion flexibility through various standard formats (standard RGB, sRGB or Adobe RGB). Additional notable features include dual-stream data outputs for separate transmission of RGB versus SWIR streams; trigger inputs with encoder support and noise reduction filters.

Key Applications:

Beyond Superiority in Agriculture & Food Processing

Table 1 showcases several key application areas where this technology excels:

Application Area Operational Benefits
Fruit, Vegetable & Nut Inspection SWIR light’s ability to penetrate deeper into organic materials makes it ideal for detecting internal defects like early decay or bruising that appear as darker shadows due to higher water absorption. This facilitates easier removal of defective items during automated sorting before packaging operations.
Semiconductor Inspection The high transmittance properties in the SWIR range allow detection not only on surface defects but also sub-surface imperfections within silicon wafers, making it essential for quality control in semiconductor manufacturing processes.
Pharmaceutical Quality Control This technology enables dual inspection tasks: external package evaluation while simultaneously analyzing internal contents through opaque containers without opening packages—revolutionizing pharmaceutical production lines requiring both aesthetic and functional checks.

Additional Use Cases Include

  • Battery Inspection
    The SWIR capability allows detailed electrode sheet analysis, revealing defects such as scratches, dents, craters or bubbles that could compromise battery performance.

More Applications

This versatile camera finds utility across various industries including: advanced web inspection in manufacturing processes (e.g., color-coated tiles and textiles), waste sorting operations for different plastic types, mineral classification systems, agricultural monitoring systems, and forestry management tools.

Last Updated: 2025-09-05 02:26:59